SEM Scanning Electron Microscope
The Scanning Electron Microscope with Energy Dispersive X-ray spectroscopy has been installed at the Department of Geology of the Faculty of Science, University of Peradeniya. The scanning electron microscope (SEM) is an instrument that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that can be detected and that contain information about the sample's surface topography and composition. SEMs have a variety of applications in a number of scientific and industry-related fields, especially where characterizations of solid materials is beneficial.
In addition to topographical, morphological and compositional information, a Scanning Electron Microscope can detect and analyse surface fractures, provide information in microstructures, examine surface contaminations, reveal spatial variations in chemical compositions, provide qualitative chemical analyses and identify crystalline structures. SEMs can be an essential research tool in fields such as geology, material sciences, life sciences, biology, medical and forensic science and metallurgy. In addition, SEM has industrial and technological applications such as semiconductor inspection, production line of miniscule products and assembly of microchips for computers.
Monday 27 September 2021
- Kindly select the date considering the color allocated for each type of sample
- Currently we undertake SEM imaging without EDX.
|Scanning Electron Microscope
Email: email@example.com TP: 0812394270
Department of Geology
Faculty of Science, University of Peradeniya
New Geology Building (Near to PGIS)
Old Galaha Road
University of Peradeniya